学术讲座：Analysis and Solution to the Spurious Emission Problem Inherent in Mobile Phones

Title: Analysis and Solution to the Spurious Emission Problem Inherent in Mobile Phones

Speaker: Dr. Haiying Jiang

Host: Prof. Minghua Xia

Time: 10:00-11:00 a.m., March 25, 2016.

Place: Rm. 207, SIST Bldg. (十大网赌网址信誉排行榜207讲学厅)

Abstract:

Electro-magnetic compatibility (EMC) is key to the development and release of mobile phones, since it does not only degrade the performance and also is mandatory for the EMC certification. Spurious emission out of limit happens very often in practice and hence it becomes an obligatory EMC test item required by the certification. In this talk, the electromagnetic topology of mobile phone and equivalent circuits for radiation mechanism will first be introduced and, then, an analysis and solution to the radiated spurious emission problem will be presented. At last, a general process to analyze and solve the EMC problem inherent in mobile phones will be illustrated, by accounting for the spurious emission introduced by shielding can.

Short Bio:

Haiying Jiang received her B.S. degree in telecommunication engineering from the PLA Telecommunication and Commanding Academy in 2003, and the M.S. and Ph.D. degrees in Electromagnetic Field and Microwave Technology from Beijing University of Posts and Telecommunications in 2006 and 2015, respectively. Her research interest is focused on RF circuit and EMC technology.

Dr. Jiang has about ten-year industrial R&D experience in the field of RF and EMC. She worked for Motorola (China) Technologies LTD in April 2006-Dec. 2011, as an Engineer, and Nokia (China) Investment Co., LTD in Dec. 2011-Dec. 2014, as a Senior RF Engineer. Since Jan. 2015, she has been working as a RF and EMC Expert in Micromax Informatics Technology (Beijing) Co. Ltd.

ALL ARE WELCOME.